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並前往https://www.semanticscholar.org/paper/MOS-Device-Aging-Analysis-with-HSPICE-and-CustomSim-Tudor-Wang/3f78524f5c3e6d7da1b2f4c322031ad1f415da80

[PDF] MOS Device Aging Analysis with HSPICE and CustomSim

Authors Bogdan Tudor Joddy Wang Weidong Liu Hany Elhak Synopsys Abstract In MOS integrated circuits, device aging is mainly due to the degradation of the ...

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