雖然這篇tof-sims鄉民發文沒有被收入到精華區：在tof-sims這個話題中，我們另外找到其它相關的精選爆讚文章
[爆卦]tof-sims是什麼？優點缺點精華區懶人包
你可能也想看看
搜尋相關網站
-
#1飛行時間二次離子質譜（TOF-SIMS）
飛行時間二次離子質譜（TOF-SIMS）是一種表面分析技術，可將脈衝的初級離子束聚焦到樣品表面，在濺射過程中產生二次離子. 分析這些次級離子可提供有關表面上存在的分子、 ...
-
#2二次離子質譜儀(TOF-SIMS) - 國立清華大學貴重儀器使用中心
二次離子質譜儀(TOF-SIMS) · 表面成份分析收費：500元/件 · 縱深分佈分析收費：1,000元/件(小時) · 平面影像分析收費：500元/件.
-
#3飛行時間二次離子質譜儀的原理與應用
Time-of-flight secondary ion mass spectrometer (TOF-SIMS) is capable of simultaneously analyzing trace organic molecules and inorganic elements in mass ranging ...
-
#4TOF-SIMS(飛行式二次離子質譜) - 歐陸檢驗
TOF -SIMS（飛行式二次離子質譜）是將一次離子脈衝束聚焦在樣品表面上，在濺射過程中產生二次離子的表面分析技術。分析這些二次離子可以得到有關表面上 ...
-
#5二次離子質譜儀(SIMS) - MA-tek 閎康科技
SIMS 另一主要應用為表面成份污染分析，如球型陣列封裝基板中金屬墊之污染監控，然而受限於入射離子束 ... Time-of-Flight SIMS [ TOF-SIMS M6 plus, IONTOF GmbH ].
-
#6Time-of-Flight Secondary Ion Mass ... - SERC - Carleton
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or ...
-
#7一文認識TOF-SIMS - 每日頭條
飛行時間-二次離子質譜儀（TOF-SIMS），是一種非常靈敏的表面分析技術。它利用一次離子激發樣品表面微量的二次離子，根據二次離子飛行到探測器的時間 ...
-
#8What is TOF-SIMS? - Ulvac-Phi
In TOF-SIMS, a Liquid Metal Ion Gun (LMIG), which has a submicron-level probe diameter and can achieve pulses of a few hundred picoseconds, is widely used as ...
-
#9TOF-SIMS（飛行時間二次離子質譜儀）_百度百科
TOF -SIMS（Time of Flight Secondary Ion Mass Spectrometry）是通過用一次離子激發樣品表面，打出極其微量的二次離子，根據二次離子因不同的質量而飛行到探測器的時間 ...
-
#10TOF-SIMS Surface Analysis Technique - Physical Electronics
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) provides elemental, chemical state, and molecular information from surfaces of solid materials.
-
#11依分析方式
(Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS). 儀器廠牌型號. IONTOF, TOF.SIMS 4,Germany. 購入日期. 2003年. 儀器原理.
-
#12乾貨| 二次離子質譜大科普！TOF-SIMS及D-SIMS例項分析
飛行時間二次離子質譜儀(TOF-SIMS)。在此類質譜儀中，二次離子被提取到無場漂移管，二次離子沿既定飛行路徑到達離子檢測器。由於給定離子的速度與其 ...
-
#13TOF SIMS | Thermo Fisher Scientific - TW
TOF SIMS (secondary ion mass spectrometry) is enabled by focused ion beam FIB milling, providing high resolution elemental characterization.
-
#14The Practice of Tof-sims: Time of Flight Secondary Ion Mass ...
書名：The Practice of Tof-sims: Time of Flight Secondary Ion Mass Spectrometry，語言：英文，ISBN：9781606507735，頁數：181，作者：Spool, Alan M.， ...
-
#15Time-of-Flight Secondary Ion Mass Spectrometry - Science ...
TOF -SIMS is a technique that detects all the elements in the periodic table, including hydrogen. TOF-SIMS can provide mass spectral information; image ...
-
#16Bi Cluster TOF-SIMS Imaging of Inorganic and Organic Materials
TOF -SIMS is a relatively new analytical method, and undeveloped scientific fields still exist from viewpoints of not only instrumental developments but also ...
-
#17Liquid ToF-SIMS revealing the oil, water, and surfactant ...
... and in situ time-of-flight secondary ion mass spectrometry (ToF-SIMS) to study the evolving O/W interface using a NAVY bilge model for the first time.
-
#18Time-of-Flight SIMS – ION-TOF SIMS 5
The ION TOF TOF-SIMS5 Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) is a highly sensitive surface analytical technique, using a pulsed and ...
-
#19Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a highly sensitive analytical technique that describes the chemical composition and ...
-
#20TOF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry)
TOF -SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) · Secondary electron microscopy (SEM): lateral resolution <40 nm. · Determines the chemical composition ...
-
#21Tof SIMS, Time-of-Flight Secondary Ion Mass Spectrometry
Tof -SIMS is also a useful tool to characterise composite materials, thin films, layer structures, corrosion mechanisms and catalysts contamination. Alternatives ...
-
#22政府研究資訊系統GRB
、LDH、Flow 與Confocal 分析)，建立一套標準分析方法；並以飛行式二次離子質譜儀(Time of Flight‐Secondary Ion Mass Spectrometer; TOF‐SIMS) 提供質譜影像數據， ...
-
#23TOF-SIMS | Image Science
Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a highly sensitive analytical technique that provides chemical characterisation of the surfaces ...
-
#24Time-of-Flight Secondary Ion Mass Spectrometry | NIST
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the ...
-
#25TOF.SIMS 5 - IONTOF - TOF-SIMS (time of flight secondary ion ...
The TOF.SIMS 5 is equipped with a gridless reflectron type Time-of-Flight analyser. The non-linear reflectron design provides high transmission and high mass ...
-
#26ToF-SIMS - TESCAN ANALYTICS
Time-of-Flight Secondary Ion Mass Spectometry or ToF-SIMS is an elementary and molecular analysis method with very high sensibility on extrem surface (‹ 0.5 ...
-
#27tofsims - Bioconductor
Import, process and analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) imaging data. Bioconductor version: Release (3.14). This packages ...
-
#28TOF-SIMS基本原理、技术特点、应用案例，当堂答疑一分不花！
飞行时间二次离子质谱仪（简称TOF-SIMS），使用一次脉冲离子入射固体材料表面，通过表面激发出的二次离子的飞行时间测量其质量, 以表征材料表面的元素 ...
-
#29Kore SurfaceSeer I TOF-SIMS
SurfaceSeer-I是一个高灵敏度的TOF-SIMS，用于绝缘和导电表面的成像和化学绘图。SurfaceSeer-I是研究表面化学性质的理想之选，同样适用于研发以及工业质量控制应用。
-
#30Time-of-Flight SIMS
Secondary ion mass spectrometry (SIMS) is a high-vacuum surface analysis technique. With ppm to ppb level detection limits, it is amongst the most sensitive ...
-
#31GCIB-TOF-SIMS
GCIB-TOF-SIMS. 表面汙染薄膜中的添加劑分析. 有機薄膜中的組成分布解析. 有機層的組成構造解析. 有機材料的低損害測定. 將最表面的汙染層以Ar-GCIB 去除後, ...
-
#32A novel ToF-SIMS operation mode for sub 100 nm lateral ...
Keywords: ToF-SIMS, Oxygen isotope analysis, Lateral resolution ... Time of flight-secondary ion mass spectrometry (ToF-SIMS) has become a very popular ...
-
#33Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
ToF -SIMS involves the use of a primary ion beam which is pulsed to produce packets of primary ions. Each primary ion packet impacts the sample surface and ...
-
#34TOF-SIMS（二次离子飞行时间质谱仪） - 科学指南针
科学指南针可为您提供TOF-SIMS服务，TOF-SIMS是通过用一次离子激发样品表面，打出极其微量的二次离子，根据二次离子因不同的质量而飞行到探测器的时间不同来测定离子 ...
-
#35Analyzing 3D hyperspectral TOF-SIMS depth profile data ...
Here, we use SOM-RPM to characterize and interpret 3D TOF-SIMS depth ... methods such as time-of-flight secondary ion mass spectrometry (TOF-SIMS) are very ...
-
#36ToF-SIMS - Keck-II - NUANCE: Northwestern
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
-
#37KNMFi - Technologies - ToF-SIMS - KIT
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is available only in less than 1.000 industrial and academic laboratories worldwide.
-
#38Time-of-Flight SIMS (ToF-SIMS) - Surface Science Western
ToF -SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) is a surface analytical technique that uses an ion beam (primary ions) to remove small numbers of ...
-
#39Publications TOF-SIMS - Empa
"Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of ...
-
#40ToF SIMS for analysis of chemical composition - SuSoS AG
Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) is an established, multifaceted and reliable method for a clear and highly sensitive ...
-
#41Time of flight secondary ion mass spectrometry (TOF-SIMS) for ...
TOF -SIMS helps clients to understand surface chemistry in organic and inorganic films. The surface chemistry is of high interest due to factors such as ...
-
#42TOF-SIMS | Time of Flight Secondary Ion Mass Spectroscopy
Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface characterization technique which is based upon the liberation and identification of ...
-
#43Laboratory for ToF-SIMS analysis - Tascon
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface analysis method for the chemical characterization of solid surfaces in the laboratory ...
-
#44ToF-SIMS - SAIF, IIT Bombay
TOF -SIMS can obtain information regarding elements or molecular species within 1 nm of the sample surface at a very high detection sensitivity. Instrument ...
-
#45静态二次离子质谱（TOF-SIMS） - 测试狗·科研服务
Q2、请问测试TOF-SIMS时，正负离子都需要测，那么需要几个样品呢？是在同一个样品上选取不同的区域吗？ 如果是质谱和二维成像，是一个位置，因为没有损伤，采集完正的 ...
-
#46In-situ ToF-SIMS analyses of deuterium re-distribution ... - Nature
In-situ ToF-SIMS analyses of deuterium re-distribution in austenitic steel AISI 304L under mechanical load. Andreas Röhsler,; Oded Sobol,; […] ...
-
#47Tof - SIMS | UCLouvain
Principles Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed beam of primary ion beams ...
-
#48TOF-SIMS Analysis of Decoherence Sources in Nb ... - arXiv
In this study, we utilize time-of-flight secondary ion mass spectrometry (TOF-SIMS) to understand the role specific fabrication procedures ...
-
#49ToF-SIMS analysis of antimony carboxylate EUV photoresists
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is used to evaluate the composition of nonvolatile photoproducts created by EUV ...
-
#50Comparison of ToF-SIMS secondary ion intensity ratios to XPS...
ToF -SIMS data of NCO-sP(EO-stat-PO) all hydrogel coatings showing the correlation between the normalized halide anion secondary ion intensities and the XPS data ...
-
#51TOF-SIMS analysis of exhaled particles from patients with ...
In the present study, we compared PEx from patients with asthma and controls using time-of-flight–secondary ion mass spectrometry (TOF-SIMS) and multivariate ...
-
#52TOF SIMS V - MCPF - Service
Time-of-flight Secondary Ion Mass Spectrometer, ToF SIMS V (ION-TOF GmbH); Equipped with Bi cluster (Bi+, Bi3+, Bi3++ etc), C60 and Cs primary ion sources.
-
#53TOF-SIMS原理和常见问题解答_离子 - 手机搜狐网
一、TOF-SIMS 飞行时间二次离子质谱仪介绍. TOF -SIMS（Time of Flight Secondary Ion Mass Spectrometry）是通过用一次离子激发样品表面，打出极其微量的 ...
-
#54Time of Flight Secondary Ion Mass Spectrometry : TOF-SIMS
Furthermore, TOF-SIMS combined with etching ion beam such as gas cluster ion beam expands the ability to depth profiling and also 3D imaging. Time-of-flight ...
-
#55ToF-SIMS - Equipment and Facilities
ToF -SIMS is an advanced label-free technique for the atomic and molecular characterisation and imaging of a broad range of materials in 2D and 3D.
-
#56New Trends and Potentialities of ToF-SIMS in Surface Studies
The ToF - SIMS studies of biomaterials are not only limited to the characterization of the structure of measured substances .
-
#57TOF-SIMS | Surface Analysis Facility - WordPress at UD |
The Facility houses the technique of time-of-flight secondary-ion mass spectrometry, with the ION-TOF TOF-SIMS IV system (upgraded with a bismuth source...
-
#58TOF-SIMS谱峰检测方法及控制软件研究- 博士
【摘要】 飞行时间二次离子质谱(TOF-SIMS)是一种有效的表面分析技术,具有样品消耗量少、可微区原位分析、检测速度快和质量范围无限制等诸多优势。
-
#59Biological tissue sample preparation for time-of-flight ...
Time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging is an analytical technique rapidly expanding in use in biological studies.
-
#60ToF-SIMS and Machine Learning for ... - ACS Publications
(24) investigated the surface chemistry of 70 different poly(meth)acrylate spots in a printed microarray, using ToF-SIMS imaging and ...
-
#61Time-of-Flight Secondary ION Mass Spectrometry (ToF SIMS)
Here, we are using a flight time analyzer, which can measure a complete mass spectrum per sputter pulse. In contrast to dynamic SIMS, ToF SIMS is a static SIMS ...
-
#62Time-of-Flight Secondary Ion Mass Spectrometry Laboratory ...
The IONTOF ToF-SIMS NCS instrument combines a Time-of-flight Secondary Ion Mass Spectrometer (ToF-SIMS) with an Atomic Force Microscope (AFM).
-
#63Development of Multiplexed ToF-SIMS Instrumentation
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful and widely used method for surface chemical analysis.
-
#64MST｜［TOF-SIMS］飛行時間型二次イオン質量分析法
最表面を高感度で分析可能; HからUまでの全元素、C,H,N,O,P,Sなどからなる有機物の分子イオンが取得可能; イメージ分析が可能; 有機・無機化合物の構造解析・同定が ...
-
#65Combining plasma profiling TOFMS with TOF-SIMS depth ...
Read our recent article showing the comparison of TOF-SIMS and Plasma Profiling TOFMS (PP-TOFMS) depth profiles of SiGe, metal silicides, ...
-
#66tof-sims分析——看完你就懂了！ - 日間新聞
飛行時間-二次離子質譜儀（TOF-SIMS），是一種非常靈敏的表面分析技術。它利用一次離子激發樣品表面微量的二次離子，根據二次離子飛行到探測器的時間不同 ...
-
#67Understanding Chemical Inhomogeneities and Cation ...
Time-of-flight secondary-ion mass spectrometry (TOF-SIMS) is one of the few techniques that can obtain chemical information from all components of hybrid ...
-
#68Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS 5)
Equipment Type: Microscopy/Surface Analysis. Information the Equipment Can Provide. Ultra-high-resolution mass spectrometry (up to 0.001 a.m.u.).
-
#69TOF-SIMS: Materials Analysis BY Mass Spectrometry 2nd Editon
ToF -SIMS: Surface Analysis by Mass Spectrometry 2nd EditionEdited by John C. Vickerman and David Briggs The Second Edition of this well-received book is ...
-
#70Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS ...
TOF -SIMS allows spectroscopy for characterization of chemical composition, imaging for mapping of the surface distribution of species, and depth profiling. It ...
-
#71ION TOF.SIMS Model 5-100 - University at Buffalo
TOF -SIMS 5, Ultra high vacuum time-of-flight mass spectrometer for chemical imaging, ion intensity mapping, depth profiling, and static mass spectra. This ...
-
#72Bioanalytics with TOF-SIMS - Justus-Liebig-Universität Gießen
Bioanalytics with TOF-SIMS. Secondary ion mass spectrometry (SIMS) is a classical method for inorganic materials analysis. Within the last two decades the ...
-
#73Time-of-Flight Secondary Ion Mass Spectrometer
Time-of-Flight Secondary Ion Mass Spectroscopy (ToF SIMS) uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface ...
-
#74TOF-SIMS | GCM Lab
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS). TOF-SIMS is one of the most powerful techniques to analyse solids since it gives the possibility ...
-
#75Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
Key words. surface analysis ToF-SIMS surface imaging polymers. To whom correspondence should be addressed.
-
#76ToF-SIMS and Machine Learning for ... - CSIRO Research
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) offers unique potential in this regard, capable of describing the chemistry associated ...
-
#77Applications of XPS, AES, and TOF-SIMS
Dynamic Secondary Ion Mass Spectrometry (D-SIMS). ➢ Time-of-Flight Secondary SIMS (TOF-SIMS). • Fourier Transform Infrared Spectroscopy(FTIR).
-
#78ToF-SIMS 3d analysis of thin films deposited in high aspect ...
For the analysis of thin films, with high aspect ratio (HAR) structures, time-of-flight secondary ion mass spectrometry (ToF-SIMS) overcomes several ...
-
#79ToF-SIMS Analysis of Dexamethasone Distribution in the ...
Time of flight secondary ion mass spectrometry (ToF-SIMS) is an extremely surface sensitive analytical technique that can characterize the chemical composition ...
-
#80一文認識TOF-SIMS - 今天頭條
TOF -SIMS的原理及特點. 飛行時間-二次離子質譜儀（TOF-SIMS），是一種非常靈敏的表面分析技術。它利用一次離子激發樣品表面微量的二次離子，根據二次 ...
-
#81ToF-SIMS | NESAC/BIO
It is these secondary ions that are mass analyzed in SIMS. In static mode of ToF SIMS, the primary ion beam is maintained at a very low fluence (typically ...
-
#82High‐resolution peak analysis in TOF SIMS data - Gelb - Wiley ...
High mass resolution time-of-flight secondary ion mass spectrometry (TOF SIMS) can provide a wealth of chemical information about a sample, ...
-
#83ToF-SIMS – Cutting Edge Chemical Analysis for Your FIB
Time of Flight Secondary Ion Mass Spectrometry or ToF-SIMS is an extremely sensitive and versatile chemical analysis technique with nanometer resolution.
-
#84TOF-SIMS | 概念理论| 技术资料
二次离子质谱（SIMS）的概念非常简单，一批拥有相同动能的离子按质量对电荷比的顺序飞行经过一条无电磁场的真空管到达离子检测器。该检测器输出电流，以时间为函数， ...
-
#85ToF-SIMS and AFM Characterization of Brown Cosmetic ...
ToF -SIMS and AFM Characterization of Brown Cosmetic Contact Lenses: From Structural Analysis to the Identification of Pigments. Seon Hee Kim , 1 ...
-
#86二次離子質譜- 維基百科，自由的百科全書
二次離子質譜（英語：Secondary Ion Mass Spectroscopy, SIMS）是用來分析固體表面或者是薄膜的化學成分的技術，其用一束聚焦的離子束濺射待測品表面，並通過檢測轟擊 ...
-
#87Services_mc_TOFSIMS - Wintech Nano-Technology Services
TOF SIMS. Time-of-flight Secondary Ion Mass Spectrometry is a versatile instrument capable of parts-per-million sensitivity or better with parallel ...
-
#88An Introduction to Time-of-Flight Secondary Ion Mass ...
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization ...
-
#89What is Time-of-Flight Secondary Ion Mass Spectrometry (TOF ...
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface analysis tool that concentrates a pulsed stream of primary ions onto a sample surface ...
-
#90ToF-SIMS – Ascent - Ascent+
ToF -SIMS. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) uses a focused, energetic primary ion beam to analyse the sample ...
-
#91ToF-qSIMS Workstation - Hiden Analytical
The Hiden ToF-qSIMS is a time of flight analyser for quadrupole mass spectrometry. The system enhances SIMS for the highest possible performance.
-
#92一文认识TOF-SIMS - 知乎专栏
TOF -SIMS的原理及特点飞行时间-二次离子质谱仪（TOF-SIMS），是一种非常灵敏的表面分析技术。它利用一次离子激发样品表面微量的二次离子， ...
-
#93二次離子質譜分析儀(SIMS) - iST宜特
二次離子質譜分析儀(Secondary Ion Mass Spectrometer, SIMS)主要是利用 ... iST的SIMS高解析度，除了針對離子植入、摻雜量的P/N濃度定量分析外，還可 ...
-
#94IONTOF ToF-SIMS – GT - IEN/IMAT Materials Characterization ...
High-Resolution 3D Elemental Analysis. TOFSIMS SIMS. The IONTOF 5-300 Time-of-Flight SIMS system uses a beam of ions to remove ...
-
#95Combination of orthogonal TOF-SIMS with FIB-SEM by ...
Korean Jeju hosted acknowledged experts in TOF-SIMS at the end of ... The Time of Flight (TOF) Secondary Ion Mass Spectrometry (SIMS) uses ...
-
#96ToF-SIMS or analysing the surface of a sample in detail
Le LIST a organisé la « 8ème réunion des utilisateurs francophones ToF-SIMS ION TOF». Cette réunion afin d'échanger sur la technique de ...
-
#97Applicability of ToF-SIMS for monitoring compositional ...
ToF -SIMS was originally developed as a technique for the analysis of inorganic solids and in particular for the evaluation of concentration ...
tof-sims 在 コバにゃんチャンネル Youtube 的最讚貼文
tof-sims 在 大象中醫 Youtube 的最讚貼文
tof-sims 在 大象中醫 Youtube 的最佳解答