你即將離開本站

並前往https://www.mri.psu.edu/materials-characterization-lab/characterization-techniques/time-flight-secondary-ion-mass

Time of Flight Secondary Ion Mass Spectrometry

Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface characterization, micro-analysis technique which is based upon the liberation and ...

確定！ 回上一頁

查詢 「tof-sims analysis」的人也找了：

  1. tof sims原理
    2.
  2. SIMS 量測
    3.
  3. SIMS resolution
    4.
  4. IONTOF
    5.
  5. Dynamic SIMS
    6.
  6. Quadrupole SIMS
    7.
  7. XPS analysis
    8.
  8. Secondary ion mass spectrometry 中文
    9.