你即將離開本站

並前往https://ieeexplore.ieee.org/document/4134492

The Dualbeam (FIB/SEM) and its Applications - IEEE Xplore

One such tool is the Dualbeam, which combines a field emission SEM column with a gallium source focussed ion beam (FIB) column. Previously used only in the ...

確定！ 回上一頁

查詢 「fib-sem」的人也找了：

  1. fib sem差異
    2.
  2. fib sem原理
    3.
  3. fib sem分析
    4.
  4. fib介紹
    5.
  5. fib原理
    6.
  6. fib切割
    7.
  7. fib切片
    8.
  8. fib聚焦離子束
    9.