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並前往https://www.cmca.uwa.edu.au/facilities/sem/fei-helios-focused-ion-beam-fib

FEI Helios Nanolab G3 CX DualBeam FIB/SEM - Centre for ...

It is the third generation of FEI's Helios Nanolab Ultra High Resolution Scanning Electron Microscope (SEM) equipped with Focused Ion Beam (FIB) technology, ...

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