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Characteristics of HfZrO x gate stack engineering for reliability ...

book ISSN : 1930-8868. book ISBN : 978-1-4577-2083-3. book e-ISBN : 978-1-4577-2084-0 , 978-1-4577-2082-6. DOI, 10.1109/VLSI-TSA.2012.6210162 ...

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