你即將離開本站

並前往https://www.kla.com/products/instruments/defect-inspectors

Candela Surface Defect Inspection | GaN SiC Wafer ... - KLA

Candela ® surface defect inspection systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, ...

確定！ 回上一頁

查詢 「Kla inspection」的人也找了：

  1. kla defect inspection原理
    2.
  2. Kla defect inspection
    3.
  3. Wafer defect inspection
    4.
  4. Defect inspection
    5.
  5. defect inspection中文
    6.
  6. kla機台介紹
    7.
  7. kla 3925波長
    8.
  8. KLA Candela 8520
    9.