你即將離開本站

並前往https://www.uvic.ca/research/advancedmicroscopy/assets/docs/FIB/FIB-TEMSamplePreparationProcedureB.pdf

HITACHI FB-2100 TEM SAMPLE PREPARATION PROCEDURE

FOCUSED ION BEAM SYSTEM: HITACHI FB-2100. TEM SAMPLE PREPARATION ... *During milling of the W-depo layer, only cut the taper. The beam will overcut and.

確定！ 回上一頁

查詢 「Hitachi ion miller」的人也找了：

  1. ion milling中文
    2.
  2. ion milling原理
    3.
  3. ion milling離子研磨
    4.
  4. hitachi im4000
    5.
  5. leica ion mill
    6.
  6. 離子研磨機
    7.
  7. Ion milling
    8.
  8. IM4000
    9.