你即將離開本站

並前往https://sro.txstate.edu/fac/arsc/equipment/microscopy/sem.html

SEM - Shared Research Operations

The FEI Helios NanoLab 400 DualBeam system is a fully digital Field Emission Scanning Electron Microscope (FE SEM) equipped with Focused Ion Beam (FIB) ...

確定！ 回上一頁

查詢 「FEI SEM」的人也找了：

  1. FEI Company
    2.
  2. FEI TEM
    3.
  3. hitachi sem
    4.
  4. fei公司
    5.
  5. FEI FIB
    6.
  6. 飛昱科技股份有限公司
    7.
  7. fei quanta 450
    8.
  8. FEI SEM
    9.