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並前往https://meridian.allenpress.com/jmep/article-abstract/16/1/21/9269/FCCSP-IMC-Growth-under-Reliability-Stress

FCCSP IMC Growth under Reliability Stress Following ...

The Kirkendall void (KV) has been a well-known issue for long term reliability of semiconductor interconnects. KVs exist at the interfaces of Cu and Sn and ...

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